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Panasonic UA3P-3100 Ultrahigh Accurate 3-D Profilometer

Panasonic UA3P-3100 represents state-of-art when measuring surface shapes. Although the measurement probe physically contacts with measured surface, the novel Atomic Force Probe (AFP) technique enables forces which do not damage the surface to be measured. The probe is held by a micro-air slider, and its movement is detected by focused laser beam to ensure ultra-low force and virtually no physical interaction between the probe and measured surface. This makes it possible to measure fragile or soft polymer surfaces without fear of scratching or damaging.

Panasonic UA3P-3100 makes it possible to measure even complex surface shapes at accuracy corresponding to l/6 for optical wavelengths. Any optical design formula or 3D data point group can be used as measurement input. The instrument finds the center of rotationally symmetric surface and identifies differences between measured and design data. This information can be used as feedback for component design.

Panasonic UA3P-3100 is an ideal metrology instrument for aspheric lenses, molds, mirrors, diffractive lenses, and free-form lenses.

The UA3P-3100 A50 key specifications

  • Probes down to 2 µm radius of curvature
  • Measuring force 0.05 – 0.30 mN
  • Measurement accuracy 0.05 µm
  • Measurement area 50 mm x 50 mm
  • Measurement range 20 mm
  • Maximum surface slope 75°
  • Maximum of 1 million measurement points, 2000 points/sec.
  • Does not damage fragile or soft surfaces

Read more: Panasonic product website